X-ray strain analysis of encapsulated Si chips

Name: X-ray strain analysis of encapsulated Si chips
Start: 2008-09-29T14:00:00+02:00
End: 2008-09-29T15:00:00+02:00
Location: No location set

by K. Friedrich, PTB Braunschweig

Monday 29 Sept 2008, 14:00 → 15:00 Europe/Berlin

Bldg. 25f, Room 456