European XFEL Science Seminar | Ultrafast solid-state photoemission spectroscopy: From the extreme ultraviolet to hard X-rays
by
Kai Rossnagel(Christian-Albrechts-University of Kiel)
→
Europe/Berlin
E1.173 Schenefeld (European XFEL)
E1.173 Schenefeld
European XFEL
Description
If you want to understand the function of materials and interfaces, study their electronic structure and microscopic dynamics. The right tool to do so is photoemission spectroscopy with added femtosecond time resolution.
Photoemission spectroscopy is an all-in-one suite of techniques: “ARPES” directly images the momentum-dependent electronic structure near the Fermi level, “XPS” probes the chemical environment of the atomic sites, and “XPD” provides atomic site-specific structural information. Add a tunable photon energy over a wide range and you can vary the probing depth from ultimate surface sensitivity in the extreme ultraviolet to interface and a bulk sensitivity in the hard X-ray regime. Finally, top it off with photon polarization, spin detection, and time resolution and you obtain a complete set of parameters and quantum numbers characterizing the electronic states in a solid.
In this talk, I will try to give a taste of the immense possibilities of “complete” photoemission spectroscopy, highlighting recent femtosecond time-resolved photoemission spectroscopy experiments using high-harmonic-generation and free-electron-laser sources.
Host: Karen Appel
