Resonant inelastic x-ray scattering with a high-resolution sapphire analyzer
by
Hasan Yavas / Argonne National Laboratory
→
Europe/Berlin
Bldg. 25b, Room 109
Bldg. 25b, Room 109
Description
Abstract:
Near back-scattering geometry is used for high-resolution x-ray analyzers in order to take advantage of increasing angular acceptance with proximity to back-scattering. For resonant measurements where the x-ray energy should be within a specific range, back-scattering planes at desired energies may not be found in the standard, highly symmetric cubic crystals. Sapphire, due to its non-centro-symmetric structure, stands out as a good alternative to the more commonly used silicon and germanium. The design of a sapphire analyzer that operates at copper K-edge with resolution below 40 meV is a detailed undertaking, and there are several challenges associated with its fabrication. However, with this cutting edge technology, the first phonon measurements at a resonant edge have been performed.
