How to study low Z element’s absorption edges at extreme conditions?
by
Christian Sternemann(TU Dortmund)
→
Europe/Berlin
AER19, Room 3.11
AER19, Room 3.11
Description
Understanding the physical and chemical properties of compounds containing low Z elements such as oxygen, lithium, magnesium, boron or silicon, plays an important role in materials and earth science. Often these materials are exposed to extreme conditions, i.e. high pressures and/or temperatures as present in the Earth’s interior or during synthesis, which makes an in-situ spectroscopic study difficult.
Here, x-ray Raman scattering provides a unique tool to measure x-ray absorption edges of such compounds enclosed in highly absorbing sample environments, e.g. diamond anvil cells or reaction chambers. A short introduction to the technique will be given and the potential of the method for in situ spectroscopic investigations at extreme conditions will be discussed
