Workshops & Conferences

hRIXS: a flexible instrument for high resolution resonant inelastic soft x-ray scattering

by Giacomo Ghiringhelli (Physics Department - Politecnico di Milano and CNR/SPIN)

Europe/Berlin
AER19/3.11 (European XFEL GmbH)

AER19/3.11

European XFEL GmbH

Albert-Einstein-Ring 1922761 Hamburg
Description
High resolution RIXS gives access to a variety of elementary and collective excitations in solids and molecules. At the XFEL RIXS can gain further selectivity by exploring the time domain and the multi-photon non-linear processes. The hRIXS spectrometer is designed for maximum performances and flexibility at a time: high resolving power (up to 30,000) when high average flux consents, variable scattering angle for new scattering geometries, high luminosity for single shot acquisitions in time-resolved mode. The optical lay-out and the general mechanical scheme of hRIXS will be presented.