X-ray grating interferometry for wavefront sensing applications

by Timm Weitkamp, Synchrotron Soleil, Gif-Sur-Yvette, France

Thursday 23 Sept 2010, 14:00 → 15:00 Europe/Berlin

AER19, Room 3.11

This presentation will address the potential of X-ray grating interferometry for applications in the characterization of X-ray wavefronts in the photon energy range above approximately 8 keV. Grating interferometry gives access to maps of local beam propagation angle with high sensitivity. It can also be used to characterize the degree of spatial coherence. While the development of this emerging technique in recent years has been focused on applications in imaging, such as phase tomography, it may also be a unique wavefront sensing tool for novel X-ray light sources and instruments.