X-ray tomography on laboratory sources with micrometer resolution

by Alexey Buzmakov (Shubnikov Institute of Crystallography, Moscow, Russia)

Thursday 2 Dec 2010, 10:00 → 11:00 Europe/Berlin

AER19, 4.14

X-ray tomography on laboratory sources is often limited by the detector resolution. We used magnifying X-ray optics (multi-element lens and Bragg magnifier) to reach a resolution of about 1 micrometer. In order to reduce the influence of noise, improved reconstruction algorithms with morphological analysis are used. Since the algorithms are quite heavy, parallelization of calculations is used. Issues of phase contrast, topo-tomography and reflectometry will be also discussed.