3–5 Feb 2016
LAL Orsay
Europe/Berlin timezone
For abstract submission use this INDICO page, registration for the WS is done at http://bit.ly/1LzyDkm

Characterization of thin irradiated epitaxial silicon sensors for the CMS phase II pixel upgrade

5 Feb 2016, 12:10
20m
Auditorium (LAL Orsay)

Auditorium

LAL Orsay

200 Voie de la Faculté 91440 Bures-sur-Yvette France, Latitude: 48.699 North Longitude: 2.171 East

Speaker

Mr Matteo Centis Vignali (University of Hamburg)

Description

The high-luminosity upgrade of the Large Hadron Collider, foreseen for 2025, neces- sitates the replacement of the tracker of the CMS experiment. The innermost layer of the new pixel detector will be exposed to severe radiation corresponding to a 1 MeV neutron equivalent fluence up to Φ eq = 2 · 10 16 cm −2 and an ionizing dose of ≈ 10 MGy after an integrated luminosity of 3000 fb −1 . Silicon crystals grown with different methods and sensor designs are under investigation in order to optimize the sensors for such high fluences. Thin planar silicon sensors are good candidates to achieve this goal, since the degradation of the signal produced by traversing particles is less severe than for thicker devices. Epitaxial pad diodes and strip sensors irradiated up to fluences of Φ eq = 1.3·10 16 cm −2 have been characterized in laboratory measurements and beam tests at the DESY II facility. The active thickness of the strip sensors and pad diodes is 100 μm. In addition, strip sensors produced using other growth techniques with a thickness of 200 μm have been studied. As the noise of the sensors increases with the accumulated fluence, the track informa- tion provided by the beam telescope is used to improve the separation of signal and noise in the strip sensors measurements, hereby improving the spectra of the collected charge. In this talk, the results obtained for p-bulk sensors are shown.

Primary author

Mr Matteo Centis Vignali (University of Hamburg)

Presentation materials