3–5 Feb 2016
LAL Orsay
Europe/Berlin timezone
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Beam test of 3D pixel detectors up to fluences of 9e15 neq/cm2

4 Feb 2016, 10:20
20m
Auditorium (LAL Orsay)

Auditorium

LAL Orsay

200 Voie de la Faculté 91440 Bures-sur-Yvette France, Latitude: 48.699 North Longitude: 2.171 East

Speaker

Mr Fabian Foerster (IFAE Barcelona)

Description

3D FEI4 pixel detectors from the IBL production were non-uniformly irradiated at CERN-PS with 23 GeV protons up to a maximum fluence of 9e15 neq/cm2. The devices have been studied in beam tests at CERN SPS and good efficiencies of >97% have been achieved at the highest fluence already at 170 V. Especially interesting is the option to study a vast range of fluences on a single pixel device due to the non-uniform beam profile. This presentation will give an overview on the achieved results.

Primary author

Mr Fabian Foerster (IFAE Barcelona)

Co-authors

Mr David Vazquez (IFAE Barcelona) Mr Emanuele Cavallaro (IFAE Barcelona) Mr Ivan Lopez Paz (IFAE Barcelona) Dr Joern Lange (IFAE Barcelona) Prof. Sebastian Grinstein (IFAE Barcelona)

Presentation materials