Tracking Polycrystalline Responses with High Energy Diffraction

by Prof. Robert Suter (Carnegie Mellon University)

Friday 8 Jan 2016, 11:00 → 12:30 Europe/Berlin

Building 1b | SR3 (DESY Hamburg)

High Energy Diffraction Microscopy is a version of Three Dimensional X-ray Diffraction Microscopy (3DXRD) implemented at the Advanced Photon Source. Near-field measurements map grain locations, shapes, orientations and orientation variations over volumes of the order of a cubic millimeter. Far-field measurements add elastic strain state sensitivity. These measurements, combined with tomographic imaging of sample shape and interior density variations, are being used to track responses to thermal, mechanical, and other externally applied loads. This talk will give an overview of facilities, data structure, and analysis tools ranging from near-field reconstructions to computational tools required to make optimal use of the data sets. Examples will include thermal responses in an aluminum sample, complex topologies in a titanium alloy, and combined near- and far-field measurements in mechanically loaded titanium. The possibility of combining these measurements with coherent diffractive imaging of individual grains using upgraded MBA-based synchrotrons will be discussed at the end.