Fluctuation X-ray Scattering: Updates and Perspectives

by Peter Zwart (Lawrence Berkley National Laboratory - LBNL)

Monday 1 Feb 2016, 14:00 → 15:00 Europe/Berlin

AER19/3.11 (European XFEL GmbH)

X-ray scattering images collected on timescales shorter than rotation diffusion times using a (partially) coherent beam result in a significant increase in information content in the scattered data. These measurements, named fluctuation X-ray scattering (FXS), are typically performed on an X-ray free-electron laser (XFEL) or can be obtained using stationary samples on a ultra-bright synchrotron lightsource. FXS can provide fundamental insights into the structure of biological molecules, engineered nanoparticles or energy-related mesoscopic materials beyond what can be obtained with standard X-ray scattering techniques. An overview of recent developments is presented.