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15:00
X-ray detectors and diagnostics for HED instrument
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Motoaki Nakatsutsumi
(European XFEL)
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15:15
Data processing requirements of the SQS instrument
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Thomas Baumann
(European XFEL GmbH)
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15:30
Common approaches to data reduction in time-resolved X-ray diffuse scattering on liquids
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Dmitry Khakhulin
(European XFEL GmbH)
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15:45
XPCS data analysis and requirements on the data treatment
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Jörg Hallmann
(European XFEL GmbH)
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16:00
Data analysis workflow for synchrotron-CDI experiments mimicking FEL Single Particle Imaging
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Klaus Giewekemeyer
(European XFEL)
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16:15
Developments in the Single Particle Imaging Analysis Pipeline at LCLS
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Chun Hong Yoon
(SLAC/LCLS)
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17:00
Discussions