by
Joachim von Zanthier(Institute of Optics, Information and Photonics University of Erlangen-Nuremberg, Germany)
→
Europe/Berlin
CFEL, Bldg. 99 (DESY Hamburg)
CFEL, Bldg. 99
DESY Hamburg
Description
Established X-ray diffraction imaging methods allow for high-resolution structure determination of crystals and molecules. While these techniques rely on coherent scattering mechanisms, incoherent processes are generally considered detrimental for imaging applications. Here we show that higher order intensity correlations of incoherently scattered X-rays can be used for imaging the full 3D structure of the scattering atoms with improved resolution over conventional methods.