Seminars

Diffractive X-Ray Optics for Imaging and Metrology Applications

Name: Diffractive X-Ray Optics for Imaging and Metrology Applications
Start: 2009-07-22T10:00:00+02:00
End: 2009-07-22T11:00:00+02:00
Location: No location set

by Christian David, Paul Scherrer Institut, Switzerland

Wednesday 22 Jul 2009, 10:00 → 11:00 Europe/Berlin

Bldg. 25f, room 456