Speaker
Nils Lockmann
(DESY)
Description
The 4-staged grating THz-spectrometer CRISP has been installed at a diffraction radiation (DR) beamline at European XFEL where the final electron beam energies of up to 17.5 GeV enable non-invasive longitudinal form factor measurements down to a few micrometers. Due to fast detectors and electronics these measurements can be carried out for all bunches inside the bunch train with a repetition rate of up to 1.1 MHz.
In this contribution first results of the spectrometer at European XFEL will be shown and bunch resolved form factor measurements will be discussed.
Primary author
Nils Lockmann
(DESY)
