European XFEL Science Seminar

Ptychography - probing the limits of diversity

by Pierre Thibault (Physics and Astronomy, University of Southampton)

XHQ/E1.173 (European XFEL)


European XFEL

Campus Schenefeld
X-ray ptychography is routinely used at most synchrotron facilities, both for imaging and beam characterisation. In this presentation I will give an overview of the method and its capabilities, with a special emphasis on recent results on XFEL beam characterisation. I will conclude with tentative remarks on the robustness limits of ptychography, and possible threats to reproducibility and uniqueness.