An overview of grain resolved diffraction techniques
The behavior of engineering materials are, to a large extent, governed by the microstructure of the material. Typically the microstructure consist of grains (spatial regions with similar lattice orientation). Grain resolved X-ray diffraction makes it possible to investigate polycrystalline sample on a grain-by-grain basis. This makes it possible to study many properties governing the material behavior which are not easily accessible with standard powder diffraction, such as distributions of secondary phases, grain shapes, stress/strain partitioning, and orientation relationships between neighboring grains to name a few.
The focus of this talk will be to give an overview of the different techniques available for grain resolved measurements. These techniques can be divided in two categories, full-field (near- and far-field 3DXRD) and scanning based (pencil-beam 3DXRD, differential aperture x-ray microscopy). Both categories will be covered in the talk, along with illustrative experiment examples from PETRA III (P03, P06, P07, and P21.2) as well as from other synchrotrons (ESRF and CHESS).