In the past few decades, nanotubes with different chemical composition have notably attracted researchers’ attention. Interest is mainly driven by their small dimensions, unique mechanical, electrical and chemical properties that make them a potential material for future electronic, nanomechanic, nanofluidic and energy-storage devices.
Structure of the nanotubes (NT) drastically affect properties of NT-based devices and applications. Transmission electron microscopy (TEM) is the most accurate method for determining basic structural parameters of NT. However, TEM methods have several disadvantages: difficulty of performing in-situ and in-operando measurements is the most prominent one among others. Diffraction by nano and micro focused X-ray beams available on 3rd generation synchrotron source could help to overcome this difficulty.
This talk will be focused on the first results of the structural analysis of single WS2 nanotubes performed at the DESY P23 beamline. Starting from quantitative consideration of the NT reciprocal space the question will be posed how structural parameters affect the experimental diffraction patterns from NT for the two cases: for the case of conventional TEM selected area electron diffraction (SAED) and for WAXS with sub-micron beams. Results of experimental WAXS investigations of the local structure of the single WS2 nanotubes will be presented. Presented data will be compared with SAED analysis of the same nanotubes, benefits and drawbacks of both techniques will be discussed.