Speaker
René Geißler
(GSI)
Description
This presentation will handle the current usage of MicroTCA in beam diagnostics devices at GSI as well as our plans for the future.
We currently use MicroTCA systems for measuring beam parameters like position, profile and intensity, for accurate timing control, for measuring voltages and for controlling GPIOs in control applications.
The MicroTCA devices currently in use will be presented as well as our experiences and problems. Our plans to port our systems to the new FAIR accelerator facility and to unify our efforts to a limited number of devices will also be presented.
Primary author
René Geißler
(GSI)
