X-ray diffraction computed tomography - recent advances and applications

by Stephen Price (Senior Scientist at Finden Ltd; Faraday Institution Industrial Research Fellow at University of Sheffield)




X-ray diffraction computed tomography (XRD-CT), is a powerful characterization technique, providing spatially resolved chemical information within materials and devices.  The result of an XRD-CT measurement is a cross-sectional slice through a sample where each pixel contains a localised diffraction pattern, making XRD-CT sensitive to minor components that can be missed by conventional bulk XRD characterisation, and therefore extremely useful for the identification of the formation and evolution of deleterious phases. This talk will provide an introduction to the technique, alongside some recent developments in data collection, processing and analysis strategies, followed by investigations of diverse materials systems including batteries and pharmaceuticals.