Seminars

Investigation of porous semiconductor layers with x-ray diffraction and reflectometry

Name: Investigation of porous semiconductor layers with x-ray diffraction and reflectometry
Start: 2007-06-15T14:15:00+02:00
End: 2007-06-15T15:45:00+02:00
Location: No location set

by Lomov, A. (Inst. of Crystallography, Moscow)

Friday 15 Jun 2007, 14:15 → 15:45 Europe/Berlin

Bldg 25b, Room 109