Speaker
Joakim Laksman
(Eur.XFEL (European XFEL))
Description
Angle resolved photo-electron spectrometers with micro-channel plate detectors and combined with fast digitizer electronics are versatile and powerful devices for providing both soft and hard X-ray non-invasive single shot photon diagnostics at MHz repetition rate X-ray free-electron lasers.
Hard X-ray beamlines imposes specific design challenges due to poor photo-ionization cross-section and very high photo-electron velocities.
Furthermore, recent advancements in machine learning enables resolution enhancement by training the photo-electron spectrometer together with an invasive high resolution spectrometer which generates a response function model.
| I plan to submit also conference proceedings | No |
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Primary author
Joakim Laksman
(Eur.XFEL (European XFEL))
Co-authors
Danilo Enoque Ferreira de Lima
(Eur.XFEL (European XFEL))
Mr
Florian Dietrich
(European XFEL)
Jan Gruenert
(Eur.XFEL (European XFEL))
Jia Liu
(Eur.XFEL (European XFEL))
Naresh Kujala
(Eur.XFEL (European XFEL))
Natalia Gerasimova
(Eur.XFEL (European XFEL))
Suren Karabekyan
(Eur.XFEL (European XFEL))
Svitozar Serkez
(Eur.XFEL (European XFEL))
Theophilos Maltezopoulos
(Eur.XFEL (European XFEL))
