23–24 Sept 2024
DESY
Europe/Berlin timezone

Sequential Experimental Design for X-ray CT

23 Sept 2024, 16:52
2m
Flash Seminar Room (DESY)

Flash Seminar Room

DESY

Notkestraße 85 22607 Hamburg Germany

Speaker

Tianyuan Wang (CWI Amsterdam)

Description

In X-ray Computed Tomography (CT), obtaining projections from various angles is crucial for 3D reconstruction. To adapt CT for real-time quality control, it's essential to reduce the scan angles while preserving reconstruction quality. Sparse-angle tomography, which achieves 3D reconstructions with fewer data, necessitates selecting the most informative angles—a challenge equivalent to solving a sequential optimal experimental design (OED) problem. However, OED issues are marked by complexity, including high-dimensional, non-convex optimization that makes adaptive solutions during scanning difficult. To navigate these complexities, we approach the sequential OED problem through a Bayesian framework, modeling it as a partially observable Markov decision process and employing deep reinforcement learning for solutions. The approach learns efficient non-greedy policies to solve a given class of OED problems through extensive offline training rather than solving a given OED problem directly via numerical optimization. Consequently, our policy efficiently identifies the most informative angles for real-time operations, significantly enhancing the practicality of sparse-angle CT in quality control scenarios. This streamlined approach ensures that CT can be efficiently integrated into quality control processes, with the potential to significantly impact the field.

Primary author

Tianyuan Wang (CWI Amsterdam)

Presentation materials

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