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10:20
Time and space resolved characterization of power electronic devices using Synchrotron radiation
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Michael Reisinger
(Infineon)
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10:50
Generating deeper insights into SiC Device Reliability and Performance? Opportunities for synchrotron based investigations!
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Tobias Erlbacher
(Nexperia)
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11:20
Examples: Ageing, Quality of substrates, structure and composition of layers and interfaces
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Ennio Capria
(ESRF)
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11:50
Discussion