Dark Field X-ray Microscopy for Materials Science at the ESRF's ID03

by Dr Carsten Detlefs (ESRF)

Tuesday 19 Nov 2024, 13:00 → 14:00 Europe/Berlin

XHQ/E1.173 (European XFEL Schenefeld)

The newly built beamline ID03 specializes in hard X-ray microscopy. The main technique offered is dark field X-ray microscopy (DFXM), as pioneered on the prototype instrument on ID06-HXM.

 

DFXM is a combination of X-ray topography and full field microscopy, where an x-ray objective lens is placed in the Bragg diffracted beam between the sample and  a high resolution detector. The magnified image has an effective resolution of ~150nm and is sensitive to minute variation of the crystal lattice, such as strain fields, dislocations,
domains formed by phase transitions, etc.

 

The technique can be applied to a wide range of materials, ranging from structural materials such as metals and alloys to functional materials such as ferroelectrics to biominerals.

 

This presentation will provide an overview of the DFXM and some recent scientific examples.

 

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https://xfel.zoom.us/j/92423672584?pwd=hXuFjbmH0sLyLer62dQNCtNfp2HanH.1

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