Speaker
Paolo Craivech
(PSI)
Description
Accurate beam characterisation is essential to enhance the performance of X-ray free-electron lasers (XFELs). This talk presents recent advances in time-resolved diagnostics and phase-space reconstruction. At SwissFEL’s Athos beamline, attosecond-resolution measurements with a variable-polarization X-band TDS enabled full FEL power profile reconstructions with pulse durations down to 300 as. In addition, a new method for five-dimensional (5D) phase-space tomography, first demonstrated at FLASHForward and later applied at SwissFEL, provides detailed insight into the spatial and momentum distributions of GeV-class electron beams.
