Hi-Acts Academy: Residual stress measurement for optimizing drill bits and more – From Science to Application

Thursday 2 Oct 2025, 13:00 → 14:00 Europe/Berlin

Zoom Online

This webinar is designed for industry professionals from R&D and production who want to explore the benefits of synchrotron analysis—without needing prior experience in the field.

Residual stresses have a decisive impact on tool performance, especially in demanding applications. Synchrotron X-ray diffraction (S-XRD) is a powerful, non-destructive method that enables high-resolution measurements deep inside components. These insights are not only valuable for science but also critically important for industry, as they influence the lifetime, safety, and overall performance of many parts and products.

 

Example residual strain/stress measurement points on drill bits. (source: Scatterin)

 

One of the main barriers for companies in using the enormous potential of synchrotron X-ray sources is the lack of in-house expertise for such measurements, as well as the complexity of analyzing and interpreting the resulting data. Scatterin, a long-standing partner of research institutions like DESY and Hereon, offers an end-to-end service for material, process, and component analysis at synchrotron X-ray facilities.

 

 

In this session, Dr. Malte Blankenburg (Beamline Scientist at DESY) and Dr. Ahmet Bahadır Yıldız (CEO and Co-Founder of Scatterin) will provide an in-depth look at how Scatterin collaborates with DESY. After a concise introduction to the S-XRD measurement method at DESY, they will present a real-world example showing how industry customers—such as HILTI—use these services to enhance drill bit performance.

 

Dr. Ahmet Bahadır Yıldız (CEO and Co-Founder of Scatterin)

 

Dr. Malte Blankenburg (Beamline Scientist at DESY)

 

The webinar will be moderated by Johannes Blum, Innovation Manager at DESY and representative of Hi-Acts, an innovation platform connecting industry, medicine, and research in the field of accelerator-based technologies.