Speaker
Description
Research done at European XFEL takes advantage of both high-throughput data, as well as the enhanced data quality. Different research topics are being explored to ensure that we continue to deliver increasingly high-quality data. The presentation expands on selected projects and research topics within three main areas. One topic includes beam automation and instrument alignment automation, which reduce the time spent in this task during the beam time, leading to a larger time budget spent on the data collection. Another avenue being explored consists of improving the quality of the diagnostics provided, combining information from multiple sources. A final research topic includes the provision of quality labels to the acquired data, and its correction, when needed.
