Seminars
Characterization of materials at the nano-scale using GI-XAS and TXM-XANES
by
Florian Meirer
(
FBK - Fondazione Bruno Kessler, Trent (Italien)
)
Friday 7 Dec 2012, 14:00
→
15:00
Europe/Berlin
Bldg. 25f, room 456 (DESY Hamburg)
Bldg. 25f, room 456
DESY Hamburg