From October 7 to October 9, 2013 the workshop "GISAXS2013" will be held in Hamburg, Germany. GISAXS2013 is a continuation of the very successful series of three international GISAXS workshops at DESY in 2005, 2007 and 2011 (http://gisaxs2011.desy.de) and the GISAS2009 satellite conference to the XIV SAS conference in Oxford (UK).
This workshop brings together different communities working in the field of thin films, nanostructures, surfaces and interfaces, to gain insights to the very powerful method of grazing incidence small angle x-ray scattering. In invited lectures the possibilities and new trends in GISAXS will be highlighted.
One poster session will allow for a profound discussion among the participants. This workshop addresses students, experienced researchers, senior scientists working in the field of and exploiting the potentials of GISAXS in the area of thin film technology.
The programme is divided in two parts: Introductory lectures will be combined with expert lectures by leading expert’s scientists of grazing incidence technology and application. In the second part of the workshop we will on hands-on GISAXS, namely on-line treatment and simulation of GISAXS data. Additionally, we will offer a visit to the new micro-and nano-focus beamline dedicated to GISAXS at the 3rd generation synchrotron radiation source PETRA III.
Please note the new date for the abstract deadline: 5th September 2013
R. Gehrke (DESY), P. Müller-Buschbaum (TU München), S.V. Roth (DESY)
For any assistance: M. Kreuzeder (email@example.com)
Registration opens on: 10 March 2013
Registration deadline: 5 September 2013