Seminars

Investigations of the structure and morphology of thin films and interfaces by X-ray diffraction and reflection

Name: Investigations of the structure and morphology of thin films and interfaces by X-ray diffraction and reflection
Start: 2008-02-08T11:00:00+01:00
End: 2008-02-08T12:00:00+01:00
Location: No location set

by C. Deiter

Friday 8 Feb 2008, 11:00 → 12:00 Europe/Berlin

Bldg. 25b, 109