WP 2: Study of Charge Losses in the Silicon Bulk using Pad Sensors and Simulations

7 Mar 2014, 09:00
15m
HS 2 (Physik Uni Göttingen)

HS 2

Physik Uni Göttingen

Fakultät für Physik Friedrich-Hund-Platz 1 37077 Göttingen

Speaker

Mr Thomas Poehlsen (University of Hamburg, IEXP)

Presentation materials