PIER Photon Science Colloquium: "Probing matter with high-resolution resonant and non-resonant inelastic X-ray scattering"

by Giulio Monaco (ESRF)

Friday, December 16, 2011 from to (Europe/Berlin)
at EMBL Seminarroom Bldg.48e
Inelastic X-ray scattering (IXS) is utilized in a large number of experimental techniques to obtain detailed information on the structure and dynamics in condensed matter. For example, non-resonant IXS with meV energy resolution is an established technique at third generation synchotron sources to measure phonon dispersion curves; moreover, resonant and non-resonant IXS setups with lower resolving power but optimized for collection of the scattering radiation over a very large solid angle are more and more used to probe electron structure and excitations. I will here discuss the status and the perspectives of high-resolution resonant and non-resonant hard IXS with the help of examples from recent experiments.