Speaker
Mr
Ivan Baev
(Physics Department, University of Hamburg)
Description
The use of STJ’s as absorber material for spectroscopic Soft X-Ray
detection is very promising in terms of energy resolution and count
rate capabilities. Because of the low excitation energy of Cooper pairs
in a superconductor (few meV) three orders of magnitude more charge
carriers than in a Si-detector are produced per photon. The ultimate
resolution limit for such a detector is therefore in the order of a few eV
instead of a few 100 eV in the soft X-ray regime. The first commercially
available 36 pixel STJ detector is characterized and implemented into
synchrotron radiation beamline operation. The achieved resolution is
10eV for 500 eV photons and 50eV for 1500eV photons with a maximal
count rate of 10 kcps per pixel. This allowed for element specific Soft
X-Ray fluorescence measurements at the P04 beamline at Petra III,
DESY.
Primary author
Mr
Ivan Baev
(Physics Department, University of Hamburg)
