(Physics and Astronomy, University of Southampton)
XHQ/E1.173 (European XFEL)
X-ray ptychography is routinely used at most synchrotron facilities, both for imaging and beam characterisation. In this presentation I will give an overview of the method and its capabilities, with a special emphasis on recent results on XFEL beam characterisation. I will conclude with tentative remarks on the robustness limits of ptychography, and possible threats to reproducibility and uniqueness.