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13:30
Welcome
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Jan Garrevoet
(DESY)
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13:35
Design of Ultra Precision Motion Systems requires a System Level Mechatronics Approach
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Theo A. M. Ruijl
(MI-Partners)
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13:55
The Coherent X-Ray Diffraction Instrument of the NanoMAX Beamline at MAX IV
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Sebastian Kalbfleisch
(MAX IV Laboratory Lund University)
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14:15
The ESRF Spectroscopy DCM
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Raymond Barrett
(ESRF)
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14:45
Fiber interferometry for position and stability control of x-ray microscopes
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Ulrich Vogt
(KTH Royal Institute of Technology)
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15:05
The APS-Upgrade PtychoProbe
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Curt Preissner
(APS)
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15:25
X-ray microscopy instrumentation at NSLS-II: imaging from sub-micrometers down to ~10 nm
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Evgeny Nazaretski
(NSLS-II)