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10:30
A liquid diffractometer for PETRA III
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Bridget Murphy
(Kiel University)
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11:10
Phase behavior and design of polyfluorenes
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Matti Knaapila
(MaxLab)
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13:05
Investigations of the structure and morphology of ultrathin films on Si by x-ray diffraction and reflection
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Carsten Deiter
(Osnabrück University)
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13:45
Organic thin films and bio-interfaces
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Bert Nickel
(Munich University)
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14:25
Strain determination at semiconductor lateral surface gratings using high resolution x-ray diffraction
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Ullrich Pietsch
(Siegen University)
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15:20
Requirement of a diffraction beamline for the study of surfaces interfaces and thin films in material science
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Maria Capitan
(CSIC Madrid)
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16:00
Synchrotron x-ray diffraction and ferroelasticity in thin films with periodic nano domains
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Beatriz Noheda
(Groningen University)
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16:40
X-ray diffraction and scattering beamline ID32 at the ESRF
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Jörg Zegenhagen
(ESRF)