Description
Ferroelectric thin films demonstrate spontaneous patterns of electric polarization, which can be manipulated with the use of electric fields and used for fast memory storage applications. The structural properties of such systems are greatly influenced by the presence of imperfections inside the crystal lattice. To date, our knowledge of the formation of imperfections and crystalline defects is partial and empirically related to crystal growth. Our focus is to develop novel coherent x-ray imaging tools that allow materials characterization at the nanoscale. We plan to use experimentally measured coherent x-ray nanodiffraction data from epitaxially grown SrTiO3 thin films and compare them with transmission electron microscopy (TEM) images and modeling.
| Field | A4: Development of experimental techniques (methodology oriented) |
|---|---|
| DESY Place | Hamburg |
| DESY Division | FS |
| DESY Group | FS-CFEL-1 |
