Speaker
Christopher James Richard
(Z_PITZ (Betrieb und Forschung))
Description
One of the primary tasks of the Photo Injector Test Facility at DESY in Zeuthen (PITZ) is to characterize and optimize L-band photo-electron sources for use at FLASH and European XFEL. AT PITZ, the transverse phase space of 17-20 MeV electron beams are measured using a single slit scan and scintillator screen method. With the trend in photoinjectors towards lower current and emittance, ensuring precise emittance measurements is becoming increasingly important. To this end, it is necessary to have good noise cleaning to measure as much of the beam as possible and to properly correct for systematic errors to improve the resolution. This talk discusses developments to improve the reliability of the emittance measurements at PITZ.
Primary author
Christopher James Richard
(Z_PITZ (Betrieb und Forschung))
