Workshop on analysing power electronic semiconductors on synchrotrons

Contribution List

6. Synchrotrons vs lab X-ray methods

Oliver Seeck (DESY)

06/11/2024, 13:20

Synchrotrons vs lab X-ray methods

Costs
Resolution
Depth
Measurement duration (automation)
Access to RI for industry (rolling proposals, groups)

7. Access to RI for industry

Ennio Capria (ESRF)

06/11/2024, 13:40

Synchrotrons vs lab X-ray methods

Access to RI for industry (rolling proposals, groups)
PAC-G: Platform for advanced characterisation Grenoble

8. Access to RI for industry: HI-ACTS

Sabine Broock (TBD) (DESY)

06/11/2024, 14:00

Synchrotrons vs lab X-ray methods

9. Automated sample feeding

Bernhard Hesse (Xploraytion)

06/11/2024, 14:20

Automation

10. Data processing

Simon Jacques (Finden)

06/11/2024, 14:40

Automation

12. Standardisation:Example: Residual stress

Nikolaj Zangnberg

06/11/2024, 16:00

13. Radiation damage to power electronics components

Martina Bauer (TBD) (GSI)

06/11/2024, 16:20

14. EU project AddMorePower

André Clausner (TBD) (IKTS)

07/11/2024, 10:00

16. Time and space resolved characterization of power electronic devices using Synchrotron radiation

Michael Reisinger (Infineon)

07/11/2024, 10:20

Special challenges for power electronics components

17. Generating deeper insights into SiC Device Reliability and Performance? Opportunities for synchrotron based investigations!

Tobias Erlbacher (Nexperia)

07/11/2024, 10:50

Special challenges for power electronics components

18. Examples: Ageing, Quality of substrates, structure and composition of layers and interfaces

Ennio Capria (ESRF)

07/11/2024, 11:20

Special challenges for power electronics components

19. Discussion

07/11/2024, 11:50

Special challenges for power electronics components

15. Summary, future challenges

Uwe Sassenberg (SaSaS Science as a Service)

07/11/2024, 12:20

11. Standardisation: Example: Residual stress

Nikolaj Zangenberg (DTI)