First workshop on Hard X-ray Micro/Nano probe at PETRA III

Session

Session on third generation SR applications I

22 Jan 2008, 11:00

109, bldg. 25b (DESY, Notkestr. 85, 22607 Hamburg)

3. Analysing materials at different length scales

Koen Janssens

22/01/2008, 11:00

4. Non-destructive 3-dimensional synchrotron-XRF trace element measurements of down to the nanoscale

Frank Brenker

22/01/2008, 11:30

19. Probing biomedical tissues - a challenge for analysis and sample preparation

Walter Schroeder

22/01/2008, 12:00