Tilo Baumbach, KIT Karlsruhe (GER): "Advanced X-ray Scattering Techniques of the in-situ characterization of Semiconductor Nanostructures"
Hiroshi Okuda, Kyoto University (JPN): "Use of tender X-rays for depth-dependent structure analysis for self-organized thin films and related materials"
Moonhor Ree, Pohang University of Science & Technology (POSTECH) (Korea): "GISAXS on functional materials"
Michael Toney, SLAC Stanford (US): "Morphology in Organic Photovoltaics as Probed by Grazing Incidence X-ray Scattering"
Henrich Frielinghaus, FZJ Jülich (GER): "Structure and Dynamics of Membranes at the Solid-Liquid Interface"
Tiberio Ezquerra, CSIC Madrid (ESP): "On the application of Grazing Incidence X-ray Scattering to characterize functional gratings, from polymer systems to fullerene grooves"
Rainer Gehrke, DESY (GER): "Software for SAXS/WAXS/GISAXS@DESY"
Eva Herzig, TU München (GER): "Exploiting in-situ grazing incidence x-ray scattering to resolve morphology formation mechanisms in organic thin films"
Peter Müller-Buschbaum, TU München (GER): "GISANS"
Christine Revenant, CEA Grenoble (F) "GISAXS from solution-processed oxide thin films"
Stephan V. Roth, DESY (GER): "High-speed GISAXS"
Shun Yu, KTH Stockholm (SWE): "In situ GISAXS study on the metallic nanostructure at the interfaces in organic electronics"
Matthias Schwartzkopf, DESY (GER): "GISAXS and High-Throughput - Current status and future challenges"
Joachim Wuttke, FZJ Jülich (GER): "BornAgain: software to simulate and fit GISAS"