18–19 May 2009
Notkestr. 85, 22607 Hamburg, Bldg. 28c, FLASH Auditorium
Europe/Berlin timezone

White-beam micro Laue-diffraction with an undulator

18 May 2009, 16:15
45m
Notkestr. 85, 22607 Hamburg, Bldg. 28c, FLASH Auditorium

Notkestr. 85, 22607 Hamburg, Bldg. 28c, FLASH Auditorium

Speaker

Dr Gene Ice (Oak Ridge National Laboratory)

Description

High-energy 3rd generation synchrotron sources offer unprecedented opportunities for the characterization of materials. Undulator sources in particular provide more than four orders of magnitude higher peak brilliance than 2nd generation sources which opens new scientific possibilities for the study of small sample volumes and weak scattering. In this talk we describe the use of undulator radiation for micro Laue diffraction on beamline 34-ID-E at the Advanced Photon Source. Both polychromatic microdiffraction tomography and related techniques are discussed and the essential instrumentation to make these experiments possible is described. The implications of the structured undulator spectra and current and future methods to best control this structure for various experiments are also discussed. Finally we speculate on specific strategies that may be possible at PETRA III for advanced characterization of small sample volumes in extreme environmental chambers and discuss undulator and instrumentation choices. This research funded by the Division of Materials Science and Engineering, Office of Basic Energy Science, U.S. Department of Energy. Experiments in part on beamline 34-ID-E of the Advanced Photon Source which is supported by the U.S. Department of Energy Office of Basic Energy Science.

Primary author

Dr Gene Ice (Oak Ridge National Laboratory)

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