X-Ray Absorption Fine Structure (XAFS) spectroscopy is an important analytical tool at synchrotron radiation facilities. It can reveal information on the local atomic structure and on the chemical valence of the absorbing atom. Due to the high versatility, this method finds applications in physics, chemistry, biology, material, environmental and earth sciences, and even in the study of cultural heritage. Thanks to the penetrating power of X-rays, XAFS allows investigating functional materials under realistic working conditions (e.g. at high temperatures and pressures).

The course is aimed at both beginners and people with basic synchrotron experience and will focus especially on the studies of catalysts and surfaces. Participants will meet leading experts in the field and gain theoretical and practical knowledge to set up ex situ and in situ XAFS measurements and to evaluate the data on their own. Further X-ray techniques available at synchrotron facilities will also be presented. The course is jointly organized by KIT and DESY with financial support from the DFG SPP2080 program. The number of participants is limited to 32 divided in 2 groups (beginners and those with basic synchrotron experience).

The course is open for everyone, in principle on a “first come, first served” basis, but with the restriction that we can not accept more than 16 participants in each of the two sub-groups. Moreover priority will be given to SPP2080 participants. There is no registration fee but participants have to arrange accommodation and travel on their own. A number of rooms will be reserved for the course participants at the DESY Hostel.

Workshop dinner: Tuesday 17.09, 19.00 h

The contingent of reserved rooms in the DESY hostel is meanwhile exhausted! Please try to find an alternative accomodation.

Organizers: E. Welter, W. Caliebe, J. Grunwaldt (ITCP), D. Doronkin (IKFT)

Seminarroom FLASH, Bldg. 28c
Notkestr. 85 22607 Hamburg