26–27 Sept 2022
DESY Hamburg
Europe/Berlin timezone

First high-inductance Dual-core Cryogenic Current Comparators of the new CCC-Sm series

Not scheduled
20m
Foyer of the Central Library / Building 04.7 (Forschungszentrum Jülich)

Foyer of the Central Library / Building 04.7

Forschungszentrum Jülich

Poster without speed talk Detector Technologies and Systems Conference Dinner with Poster exhibit

Speaker

Volker Tympel (Helmholtz Institute Jena)

Description

Cryogenic Current Comparators (CCC) are presently used at CERN-AD (100 mm beamline diameter) and in the FAIR project at CRYRING (150 mm beamline diameter) for non-destructive absolute measurement of beam currents in the range of below 10 μA (current resolution 10 nA). Both sensor versions (CERN-Nb-CCC and FAIR-Nb-CCC-XD) use niobium as superconductor for the DC-transformer and magnetically shielding. The integrated flux concentrators have an inductance of below 100 μH at
4.2 Kelvin. The new Sm-series (Smart & Small) is designed for a beamline diameter of 63 mm and is using lead as superconductor. The first sensor (IFK-Pb-DCCC-Sm-200) has two core-based pickup coils (2x 100 µH at 4.2 K) and two SQUID units, to eliminate Barkhausen current jumps as part of the low frequency 1/f2-noise. During the construction some basic experiments on noise behavior (fluctuation– dissipation theorem, white noise below 2 pA/sqrt(Hz)) and magnetic shielding (core- inductance/meander-shielding-capacity resonance, additional mu-metal shielding) were undertaken, the results of which are presented here. Finally, a current resolution of 500 pA could be achieved in the laboratory.
Presented @ IBIC’22, 11th - 15th Sept. 2022, Krakow. Supported by the BMBF, project number 05P21SJRB1.

Primary author

Volker Tympel (Helmholtz Institute Jena)

Co-authors

David Haider (GSI Helmholtz Centre for Heavy Ion Research) Lorenzo Crescimbeni (Friederich schiller universität jena) Thomas Sieber (GSI) Frank Schmidl (Friedrich-Schiller-university Jena, Institute of Solid State Physics) Prof. Paul Seidel (University Jena) Frank Machalett (University Jena) Thomas Stöhlker (Helmholtz Institute Jena) Max Stapelfeld (University Jena) Marcus Schwickert (GSI) Matthias Schmelz (Leibniz-IPHT Jena) Ronny Stolz (Leibniz-IPHT Jena) Thomas Schönau (Leibniz-IPHT Jena) Vyacheslav Zakosarenko (Leibniz-IPHT Jena)

Presentation materials