PETRA III Workshop: HighRes and RSD Beamlines

Investigations of the structure and morphology of ultrathin films on Si by x-ray diffraction and reflection

27 Sept 2007, 13:05

40m

456 (DESY, Notkestr. 85, 22607 Hamburg)

High Resolution and Diffraction Beamline

Speaker

Carsten Deiter (Osnabrück University)