PETRA III Workshop: HighRes and RSD Beamlines

Session

High Resolution and Diffraction Beamline

27 Sept 2007, 10:30

456 and 109 (DESY, Notkestr. 85, 22607 Hamburg)

19. A liquid diffractometer for PETRA III

Bridget Murphy (Kiel University)

27/09/2007, 10:30

20. Phase behavior and design of polyfluorenes

Matti Knaapila (MaxLab)

27/09/2007, 11:10

21. Investigations of the structure and morphology of ultrathin films on Si by x-ray diffraction and reflection

Carsten Deiter (Osnabrück University)

27/09/2007, 13:05

22. Organic thin films and bio-interfaces

Bert Nickel (Munich University)

27/09/2007, 13:45

23. Strain determination at semiconductor lateral surface gratings using high resolution x-ray diffraction

Ullrich Pietsch (Siegen University)

27/09/2007, 14:25

24. Requirement of a diffraction beamline for the study of surfaces interfaces and thin films in material science

Maria Capitan (CSIC Madrid)

27/09/2007, 15:20

25. Synchrotron x-ray diffraction and ferroelasticity in thin films with periodic nano domains

Beatriz Noheda (Groningen University)

27/09/2007, 16:00

26. X-ray diffraction and scattering beamline ID32 at the ESRF

Jörg Zegenhagen (ESRF)

27/09/2007, 16:40