20–23 Sept 2009
DESY, Notkestr. 85, 22607 Hamburg, Bldg. 5 (Auditorium)
Europe/Berlin timezone

Combining imaging ellipsometry with GISAXS for an in situ characterization of nanostructures

22 Sept 2009, 15:00
20m
Auditorium, bldg. 5 (DESY, Notkestr. 85, 22607 Hamburg, Bldg. 5 (Auditorium))

Auditorium, bldg. 5

DESY, Notkestr. 85, 22607 Hamburg, Bldg. 5 (Auditorium)

Speaker

Volker Körstgens (Munich Technical University)

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