Speaker
Leonie Bauer
(GSI)
Description
In beam diagnostics cameras are used for beam characterization by imaging beam induced fluorescence (BIF). This way the transverse profile of the beam can be determined. The amount of light generated through BIF is in many cases very low. Under such conditions extremely sensitive camera systems have to be used. The final aim of the work presented here is to compare three different such systems: emCCD, ICCD and sCMOS. As light sources for this comparison LEDs at different wavelenghts will be used. The present contribution gives an overview of the work done to characterize these LEDs and of the experimental setup prepared for performing the comparison.
Primary author
Leonie Bauer
(GSI)
Co-authors
Dr
Hendrik Hähnel
(Goethe Universität Frankfurt)
Peter Forck
(GSI)
Serban Udrea
(GSI Helmholtzzentrum für Schwerionenforschung)
