9–11 Oct 2023
Karlsruhe Institute of Technology (KIT)
Europe/Berlin timezone

Analysis of semiconductor components as temperature sensors for cryogenic investigation of SRF materials

9 Oct 2023, 18:00
5m
Gaede Lecture Hall (Bldg 30.22) (Karlsruhe Institute of Technology (KIT))

Gaede Lecture Hall (Bldg 30.22)

Karlsruhe Institute of Technology (KIT)

Kaiserstr. 12 76131 Karlsruhe
Poster with speed talk Accelerator Research and Development Plenary III - Speedtalks

Speaker

Alexander Cierpka (HZB)

Description

Temperature mapping systems have been used for many years to detect local heating in an SRF cavity surface or materials sample. They require a large number of temperature sensors. Most often, low-cost Allen-Bradley resistors are used for this purpose. Since they have poor sensitivity and reproducibility above $4 \,$K, sensor alternatives that combine the precision of Cernox sensors with the low-cost of Allen-Bradley resistors would be highly desirable. In this work various semiconductor components that exhibit a temperature dependent electrical response, such as diodes and LEDs were analyzed with respect to sensitivity, reproducibility and response speed in a temperature range between $6.5\,$K and $22\,$K. In this range, many diodes and LEDs were found to be more sensitive than Cernox sensors. However, in some components the response time was slow – possibly due to poor thermal contact.

Speed Talks Normal

Primary author

Alexander Cierpka (HZB)

Co-authors

Dr Sebastian Keckert (HZB) Felix Kramer (HZB) Oliver Kugeler (HZB) Jens Knobloch (HZB)

Presentation materials